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img{max-width:100%} JEOL US124698 PCB Card JSM-6300F SEM Scanning Electron Microscope Working Spare
200-59-693
Assembly Part No: 5085-405145-16 AIR OPE ASSY (SR)
Electrode Cover
Sony XC-56BB-FEP Progressive Camera Module 4S588-495 Nikon NSR-S205C Working
FEI Company 4022.192.9204 Processor PCB Card UDTB/N XL 830 FIB-SEM Used Working img{max-width:100%} JEOL US124698 PCB CardFEI Company 4022. 192. 9204 Processor PCB Card UDTB N XL 830 FIB SEM Used Working Inventory # A 13996 Part No: 4022. 192. 9204 Model No: UDTB N FEI Company XL 830 DualBeam FIB SEM Focused Ion Beam Scanning Electron Microscope System This FEI Company 4022. 192. 9204 Processor PCB Card is used working surplus. FEI Company XL 830 DualBeam FIB SEM Focused Ion Beam Scanning Electron Microscope System. The physical condition is good, but there are signs of