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JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Untested Surplus 0 TIRA Guide Adjustment Tool

SKU: 19461282852

4.0
USD1336.97 USD1375.97

Pay in 4 interest-free payments of $334.24 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Jul 30 - Aug 4

Description

0 TIRA Guide Adjustment Tool is used working surplus

5080-193321-11 SPACER TK001-04-009-0 2

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Reseller Lot of 6 Kit Includes

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JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Untested Surplus 0 TIRA Guide Adjustment ToolJEOL JSM 6300F SEM Scanning Electron Microscope Column Assembly Untested Surplus Model No: JSM 6300F Column Removed from a JEOL JSM 6300F SEM Scanning Electron Microscope System Untested As Is This item is untested surplus. The unit has some scuffs to the paint (see photos). The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Sold As Is for Parts or Repair Estimated Packed Shipping Dimensions:

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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